TY - null JO - Automation Science and Engineering, IEEE Transactions on TI - Automated Pick-Place of Silicon Nanowires T2 - Automation Science and Engineering, IEEE Transactions on IS - 99 SN - 1545-5955 VO - PP SP - 1 EP - 8 AU - Ye, X. AU - Zhang, Y. AU - Ru, C. AU - Luo, J. AU - Xie, S. AU - Sun, Y. Y1 - 0 PY - 2013 KW - Image edge detection KW - Micromechanical devices KW - Nanowires KW - Probes KW - Scanning electron microscopy KW - Substrates KW - Visualization KW - Automated nanomanipulation KW - nanorobotic pick-place KW - nanowires KW - scanning electron microscopes (SEM) VL - PP JA - Automation Science and Engineering, IEEE Transactions on DO - 10.1109/TASE.2013.2244082 ER -